1–6 Jun 2025
Taipei International Convention Center (TICC)
Asia/Taipei timezone

Impact of beam background and jitter on LUXE IP chamber and diagnostics

THPS082
5 Jun 2025, 15:30
2h
Exhibiton Hall A _Salmon (TWTC)

Exhibiton Hall A _Salmon

TWTC

Poster Presentation MC6.T03 Beam Diagnostics and Instrumentation Thursday Poster Session

Speakers

Marin Deniaud (Cockcroft Institute) Stewart Boogert (Cockcroft Institute)

Description

LUXE is an international project that aims to study Quantum Electro-Dynamics processes that occur in the strong field regime. Using the electron beam from the European XFEL, this experiment will perform electron-laser and photon-laser collisions. Beamline simulations are required to understand what beam properties and backgrounds are expected at key locations. The beam optics was design and simulated with MAD-8 and this used to create a BDSIM simulation. To perform high precision interactions it is crucial that the transverse size and position of the electron beam can be measured. The variation of the beam position over time also has impacts on an efficient collision with the laser. This study uses simulated virtual measurement, wire scanning methods, and real measurements at the XFEL to evaluate those parameters. Finally, background from both the upstream beam line and the different dumps must be estimated to ensure that the impacts on the experiment are low enough. This paper present BDSIM simulations with high statistics necessary to evaluate the background. Critical for BDSIM studies is finding optimised ways to do cross-section biasing and final state splitting in the dumps.

Region represented Europe
Paper preparation format LaTeX

Author

Marin Deniaud (Cockcroft Institute)

Co-author

Stewart Boogert (Cockcroft Institute)

Presentation materials

There are no materials yet.