Speaker
Sophie Morard
(Université Paris-Saclay, CNRS/IN2P3, IJCLab)
Description
A recent analysis of emittance measurements highlighted the limited reliability of tools for precise method evaluation and error calculations. In this paper, a new analysis method is presented with its associated errors calculations. It is evaluated using realistic beam simulations and compared to the linear regression method commonly referenced in the literature. This new analysis method is shown to be easier to implement and provides results with a good confidence interval.
| Region represented | Europe |
|---|---|
| Paper preparation format | LaTeX |
Author
Sophie Morard
(Université Paris-Saclay, CNRS/IN2P3, IJCLab)
Co-authors
Enrique Minaya Ramirez
(Université Paris-Saclay, CNRS/IN2P3, IJCLab)
Julien Michaud
(Université Paris-Saclay, CNRS/IN2P3, IJCLab)
Dr
Luc Perrot
(Université Paris-Saclay, CNRS/IN2P3, IJCLab)
