Speaker
Description
Transverse beam profile diagnostics for high intensity beams are very challenging as material inserts are untenable. An alternative single shot beam diagnostic was studied, and developed, that consists of a thin sheet of gas. When a charged particle beam traverses the gas sheet, the neutral particles are ionized. The ionization products are then imaged on a monitor and the time of flight is recorded. Based on the specific ionization mechanism at play, the transverse beam profile of the beam can be reconstructed. An experiment at low beam energy was performed at UCLA, and demonstrated the basic concept for impact ionization. Future steps include demonstrating the concept for higher intensity beams as well as technical system modifications to improve the utility in large scale facilities.
| Region represented | America |
|---|---|
| Paper preparation format | LaTeX |
