1–6 Jun 2025
Taipei International Convention Center (TICC)
Asia/Taipei timezone

Progress towards longitudinal bunch profile monitor at the Argonne Wakefield Accelerator employing phase diversity electro-optic sampling

THPM076
5 Jun 2025, 15:30
2h
Exhibiton Hall A _Magpie (TWTC)

Exhibiton Hall A _Magpie

TWTC

Poster Presentation MC6.T03 Beam Diagnostics and Instrumentation Thursday Poster Session

Speaker

Spencer Kelham (Northern Illinois University)

Description

Precise measurement of an electron bunch’s longitudinal profile is critical for wakefield accelerators as shaped electron bunches can improve transformer ratios in collinear wakefield acceleration. Electro-Optic sampling of terahertz (THz) radiation from the bunch is one of the most attractive approaches to provide a view into the structure of a relativistic electron bunch due to its non-destructive nature. Recent developments in spectral encoding methods have shown that Phase Diversity Electro-Optic Sampling (DEOS) can accurately retrieve profiles from both sub-picosecond bunches and those requiring long sampling time windows near the traditional resolution limits. We report the progress on DEOS measurements using coherent transition radiation (CTR), as well as simulations of retrieved THz fields from arbitrary shaped electron bunches using various crystal and probe-laser configurations.

Funding Agency

DOE-SCGSR

Region represented America
Paper preparation format LaTeX

Author

Spencer Kelham (Northern Illinois University)

Co-authors

Gwanghui Ha (Northern Illinois University) Philippe Piot (Northern Illinois University) Yawei Yang (Argonne National Laboratory)

Presentation materials

There are no materials yet.