1–6 Jun 2025
Taipei International Convention Center (TICC)
Asia/Taipei timezone

Study on the characteristics of the XFEL beam source in the hard X-ray beamline at PAL-XFEL

MOPB031
2 Jun 2025, 16:00
2h
Exhibiton Hall A _Bear (TWTC)

Exhibiton Hall A _Bear

TWTC

Poster Presentation MC2.A06 Free Electron Lasers (FELs) Monday Poster Session

Speaker

Chi Hyun Shim (Pohang Accelerator Laboratory)

Description

Understanding the characteristics of the beam source is crucial for designing optimal beamline optics. During the construction of PAL-XFEL, simulation studies on the characteristics of the XFEL beam source were conducted in advance to aid in the design of beamline optics and experimental instruments. However, since the facility began providing user services in 2017, the performance of PAL-XFEL has been continuously improving. Consequently, it is anticipated that the characteristics of the XFEL beam source have changed from those at the time of initial construction. Despite this, measurement-based studies on the XFEL beam characteristics have not yet been conducted. Recent experimental results have revealed discrepancies between the design values and the observed focal position and size of the XFEL beam when it is focused using the compound refractive lens installed in the experimental hutch of the beamline. In this presentation, the current characteristics of the XFEL beam source in the hard X-ray beamline at PAL-XFEL will be discussed based on simulations and experiments. The characteristics of the XFEL beam source in the planned hard X-ray beamline will also be addressed.

Region represented Asia
Paper preparation format Word

Author

Chi Hyun Shim (Pohang Accelerator Laboratory)

Co-authors

Jinback Kang (Pohang Accelerator Laboratory) Kookjin Moon (Pohang Accelerator Laboratory) MyungHoon Cho (Pohang Accelerator Laboratory) Sunam Kim (Pohang Accelerator Laboratory)

Presentation materials

There are no materials yet.