1–6 Jun 2025
Taipei International Convention Center (TICC)
Asia/Taipei timezone

Measurement techniques using the electron beam profile scanner at the Fermilab Main Injector

WEAN1
4 Jun 2025, 09:30
20m
Hall 201 (TICC)

Hall 201

TICC

Contributed Oral Presentation MC6.T03 Beam Diagnostics and Instrumentation WEAN:Beam Instrumentation and Controls, Feedback and Operational Aspects (Contrubited)

Speaker

Matilda Mwaniki (Illinois Institute of Technology)

Description

This work presents techniques for non-invasive transverse profile measurements of high-intensity proton beams using an Electron Beam Profile Scanner (EBPS). The EBPS utilizes low-energy electrons as a probe to analyze the transverse size of proton beams, allowing for potential analysis on a single-bunch basis. Recent upgrades to the Fermilab Main Injector have enhanced beam power on target to 1 MW, with future developments targeting 2 MW. The higher beam power has increased the demand for non-invasive diagnostics, as invasive methods can disrupt operations.
The techniques presented include 1) the slow scan technique, which serves as a proof of concept for the probe beam, 2) the one-shot scan technique for measuring horizontal beam profiles, and 3) the raster scan technique for analyzing horizontal beam profiles as a function of the longitudinal distribution of the beam. The profiles obtained will be crucial for studying and understanding instabilities in high-power, high-intensity proton beams. This will contribute to optimizing the operation of high-power proton accelerators by minimizing beam loss, activation, and damage to both the diagnostics and the accelerator components.

Region represented America
Paper preparation format LaTeX

Author

Matilda Mwaniki (Illinois Institute of Technology)

Co-authors

Randy Thurman-Keup (Fermi National Accelerator Laboratory) Robert Ainsworth (Fermi National Accelerator Laboratory) Pavel Snopok (Illinois Institute of Technology)

Presentation materials

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