27 September 2026 to 1 October 2026
Hilton San Francisco - Financial District
America/Los_Angeles timezone

Advances in beam line diagnostics for the VENUS ion source

1 Oct 2026, 09:30
30m
Hilton San Francisco - Financial District

Hilton San Francisco - Financial District

750 Kearny Street, San Francisco, CA 94108
Contributed Oral Presentation THA: Oral session

Speaker

Jessica Rehak (Lawrence Berkeley National Laboratory)

Description

An essential part of electron cyclotron resonance (ECR) ion source optimization and operation is the analysis of extracted ion beams. Reliable and accurate beam line analysis of the multi-species ion beam provides a vital indicator of ECR operation. In this work, we present new developments and improvements to beam line diagnostic tools developed for the VENUS ion source at Lawrence Berkeley National Lab, including rapid charge-state-distribution measurements and emittance scans. Our focus on making measurements fast and available with a single button press has made them a part of routine operation for both source and accelerator operators. Operator-facing tools are written in Python 3 and leverage graphical interfaces for user interaction and remote databases for data storage, retrieval, and collaboration. This work discusses how using large language models (LLMs) aided the rapid development of interface design without compromising the scientific basis for the tools. By using LLMs to do much of the initial interface work and design iterations, more time was available to develop better analysis methodologies. The tools and methods presented can be adapted or used directly to diagnose the performance and beam of various ion sources.

Classification MC6: Applications and diagnostics
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Author

Jessica Rehak (Lawrence Berkeley National Laboratory)

Co-authors

Damon Todd (Lawrence Berkeley National Laboratory) Janilee Benitez (Lawrence Berkeley National Laboratory) Miles Chen (Lawrence Berkeley National Laboratory) Thomas Thuillier (Lawrence Berkeley National Laboratory)

Presentation materials

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